Single-Shot, Single-Mask X-ray Dark-field and Phase Contrast Imaging
Jingcheng Yuan, Mini Das

TL;DR
This paper presents a novel single-mask X-ray imaging system that captures attenuation, phase contrast, and dark-field images simultaneously in a single exposure, simplifying setup and reducing costs.
Contribution
The study introduces a new single-mask design for X-ray imaging that requires only one mask and low-resolution detectors, enabling multi-contrast imaging without complex setups.
Findings
Achieves simultaneous multi-contrast imaging in a single exposure
Eliminates need for high-coherence X-ray sources and complex detectors
Offers flexible system variations for different contrast types
Abstract
X-ray imaging, traditionally relying on attenuation contrast, struggles to differentiate materials with similar attenuation coefficients like soft tissues. X-ray phase contrast imaging (XPCI) and dark-field (DF) imaging provide enhanced contrast by detecting phase shifts and ultra-small-angle X-ray scattering (USAXS). However, they typically require complex and costly setups, along with multiple exposures to retrieve various contrast features. In this study, we introduce a novel single-mask X-ray imaging system design that simultaneously captures attenuation, differential phase contrast (DPC), and dark-field images in a single exposure. Most importantly, our proposed system design requires just a single mask alignment with relatively low-resolution detectors. Using our novel light transport models derived for these specific system designs, we show intuitive understanding of contrast…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Radiation Shielding Materials Analysis · Crystallography and Radiation Phenomena
