A Foundation Model for Non-Destructive Defect Identification from Vibrational Spectra
Mouyang Cheng, Chu-Liang Fu, Bowen Yu, Eunbi Rha, Abhijatmedhi Chotrattanapituk, Douglas L Abernathy, Yongqiang Cheng, and Mingda Li

TL;DR
This paper introduces DefectNet, a foundation machine learning model that accurately predicts the type and concentration of point defects in materials from vibrational spectra, enabling non-destructive defect analysis.
Contribution
The work presents a novel foundation model that generalizes defect identification across multiple materials using vibrational spectra, with high accuracy and transferability.
Findings
Accurately predicts defect types and concentrations from vibrational spectra.
Generalizes well to unseen materials and elements.
Validated on experimental inelastic scattering data.
Abstract
Defects are ubiquitous in solids and strongly influence materials' mechanical and functional properties. However, non-destructive characterization and quantification of defects, especially when multiple types coexist, remain a long-standing challenge. Here we introduce DefectNet, a foundation machine learning model that predicts the chemical identity and concentration of substitutional point defects with multiple coexisting elements directly from vibrational spectra, specifically phonon density-of-states (PDoS). Trained on over 16,000 simulated spectra from 2,000 semiconductors, DefectNet employs a tailored attention mechanism to identify up to six distinct defect elements at concentrations ranging from 0.2% to 25%. The model generalizes well to unseen crystals across 56 elements and can be fine-tuned on experimental data. Validation using inelastic scattering measurements of SiGe…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Fault Detection and Control Systems · Mineral Processing and Grinding
MethodsSoftmax · Attention Is All You Need
