Sequential tilting 4D-STEM for improved momentum-resolved STEM field mapping

TL;DR

This paper introduces a sequential tilting method in 4D-STEM that enhances momentum-resolved field mapping by enabling customizable beam tilts and improved data analysis without hardware modifications.

Contribution

The authors propose a hardware-free sequential tilting approach in 4D-STEM for better MRSTEM field mapping, allowing optimized tilt patterns and advanced data analysis techniques.

Findings

Improved accuracy in mapping nanoscale magnetic and electric fields.

Ability to use arbitrary beam tilt patterns for specific applications.

Enhanced data quality through virtual diffraction pattern analysis.

Abstract

Momentum-resolved scanning transmission electron microscopy (MRSTEM) is a powerful phase-contrast technique that can map lateral magnetic and electric fields ranging from the micrometer to the subatomic scale. Resolving fields ranging from a few nanometers to a few hundred nanometers, as well as across material junctions, is particularly important since these fields often determine the functional properties of devices. However, it is also challenging since they are orders of magnitude smaller than atomic electric fields. Thus, subtle changes in diffraction conditions lead to significant changes in the measured MRSTEM signal. One established approach to partially overcome this problem is precession electron diffraction, in which the incident electron beam is continuously precessed while precession-averaged diffraction patterns are acquired. Here, we present an alternative approach in which we sequentially tilt the incident electron beam and record a full diffraction pattern for each tilt and spatial position. This approach requires no hardware modification of the instrument and enables the use of arbitrary beam tilt patterns that can be optimized for specific applications. Furthermore, recording diffraction patterns for every beam tilt allows access to additional information. In this work, we use this information to create virtual large-angle convergent beam electron diffraction (vLACBED) patterns to assess MRSTEM data quality and improve field measurements by applying different data analysis methods beyond simple averaging. The presented data acquisition concept can readily be applied to other 4D-STEM applications.