Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements
Daniel Schmidt, David. v. Stetten, Michael Agthe, Arwen R. Pearson, Goddfrey .S. Beddard, Briony A. Yorke, Friedjof Tellkamp, Peter Gaal

TL;DR
This paper introduces advanced timing schemes for time-resolved X-ray diffraction that achieve high temporal resolution and flux, demonstrated at two beamlines across millisecond and microsecond scales.
Contribution
It presents a novel method using patterned probe pulse sequences generated with the WaveGate pulse picker for improved timing in X-ray diffraction.
Findings
Feasibility demonstrated at two beamlines
Achieved high temporal resolution with maintained flux
Effective on millisecond and microsecond timescales
Abstract
We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs patterned probe pulse sequences that are generated with the WaveGate solid-state pulse picker. We demonstrate the feasibility of our method at two different beamlines on millisecond and microsecond timescales.
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Laser-Plasma Interactions and Diagnostics · High-pressure geophysics and materials
