Extend IVerilog to Support Batch RTL Fault Simulation
Jiaping Tang, Jianan Mu, Zizhen Liu, Zhiteng Chao, Jing Ye, Huawei Li

TL;DR
This paper enhances IVerilog to enable batch RTL fault simulation by integrating event-driven and concurrent algorithms, significantly improving simulation performance for functional safety verification.
Contribution
The paper introduces an extended IVerilog simulator supporting batch RTL fault simulation with combined algorithms, offering substantial performance gains.
Findings
Achieves 2.2× speedup over commercial simulator
Achieves 3.4× speedup over open-source simulator
Improves efficiency in RTL fault simulation for safety standards
Abstract
The advancement of functional safety has made RTL-level fault simulation increasingly important to achieve iterative efficiency in the early stages of design and to ensure compliance with functional safety standards. In this paper, we extend IVerilog to support batch RTL fault simulation and integrate the event-driven algorithm and the concurrent fault simulation algorithm. Comparative experiments with a state-of-the-art commercial simulator and an open-source RTL fault simulator demonstrate that our simulator achieves a performance improvement of 2.2 and 3.4, respectively.
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Taxonomy
TopicsRadiation Effects in Electronics · VLSI and Analog Circuit Testing · Formal Methods in Verification
