Inferring charge-noise source locations from correlations in spin qubits
Juan S. Rojas-Arias, Akito Noiri, Jun Yoneda, Peter Stano, Takashi Nakajima, Kenta Takeda, Takashi Kobayashi, Giordano Scappucci, Seigo Tarucha, Daniel Loss

TL;DR
This paper studies low-frequency charge noise in silicon spin qubits, revealing that a few two-level fluctuators dominate the noise and that cross-correlations can locate these noise sources spatially.
Contribution
It introduces a method to infer the spatial locations of charge noise sources using cross-correlations in spin qubit energy fluctuations.
Findings
Charge noise is dominated by a few two-level fluctuators.
Cross-correlations reveal the spatial location of TLFs.
Noise spectra deviate from simple power-law behavior.
Abstract
We investigate low-frequency noise in a spin-qubit device made in isotopically purified Si/Si-Ge. Observing sizable cross-correlations among energy fluctuations of different qubits, we conclude that these fluctuations are dominated by charge noise. At low frequencies, the noise spectra are not well described by a power law; instead, they reveal the presence of a few individual two-level fluctuators (TLFs). We demonstrate that the noise cross-correlations allow one to get information on the spatial location of such individual TLFs.
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