Size dependence of the properties of synthetic-antiferromagnet-based stochastic magnetic tunnel junctions for probabilistic computing
Takuma Kinoshita, Ju-Young Yoon, Nuno Ca\c{c}oilo, Ryota Mochizuki,, Haruna Kaneko, Shun Kanai, Hideo Ohno, and Shunsuke Fukami

TL;DR
This paper investigates how the size of synthetic-antiferromagnet-based stochastic magnetic tunnel junctions affects their properties, revealing size-dependent behaviors that are crucial for reliable probabilistic computing applications.
Contribution
It provides a systematic analysis of size effects on SAF s-MTJs, highlighting their impact on relaxation times, magnetic robustness, and voltage insensitivity for improved p-computer performance.
Findings
Smaller junctions have shorter relaxation times.
Decreased size enhances magnetic field robustness.
Reduced size increases insensitivity to bias voltage.
Abstract
Stochastic magnetic tunnel junctions (s-MTJs) are core components for spintronics-based probabilistic computing (p-computing), a promising candidate for energy-efficient unconventional computing. To achieve reliable performance under practical conditions, the use of a synthetic antiferromagnetic (SAF) free-layer configuration was proposed due to its enhanced tolerance to magnetic field perturbations. For engineering the SAF s-MTJs, we systematically investigate the properties of the SAF s-MTJs as a function of the junction size. We observe that decreasing junction size leads to shorter relaxation times, enhanced magnetic field robustness, and enhanced insensitivity to bias voltage. These findings provide key insights toward high-performance p-computers with reliable operation.
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Taxonomy
TopicsMagnetic properties of thin films · Ferroelectric and Negative Capacitance Devices · Advanced Memory and Neural Computing
