Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis
M.Cataldo, A.D Hillier, O.Cremonesi, F.Grazzi, S.Porcinai, M.Clemenza

TL;DR
This paper introduces a Monte Carlo simulation-based method to enhance depth profiling of elemental composition in layered heritage artifacts using muonic atom X-ray emission spectroscopy, enabling non-destructive analysis of micrometer-scale features.
Contribution
It develops a novel approach coupling {0}-XES with Monte Carlo simulations (GEANT4/ARBY and SRIM/TRIM) for accurate depth profiling of multi-layered materials.
Findings
Simulations accurately estimated gold layer thickness in gilded bronze.
Method validated against SEM measurements with consistent results.
Enhanced interpretation of {0}-XES data for heritage conservation applications.
Abstract
Gildings, patinas and alteration crusts are common features of many heritage artefacts, especially for metals. Their size depends on many factors, like the manufacturing method for gildings or the conservation state for alteration crusts: in some cases, it can be in the scale of the tens of microns. Such thickness would be difficult to investigate with classical non-destructive methods and would prevent getting information from the bulk of the sample. This work proposes an innovative approach for the study of multi-layered materials with the Muonic atom X-ray Emission Spectroscopy technique ({\mu}-XES). Based on the detection of the high-energy X-rays emitted after the muon capture by the atom, this method is characterised by a remarkable penetration depth (from microns to cm). From the surface to the bulk, this technique can evaluate the variation of the elemental composition as a…
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