Role of Noise on Defect Formation and Correlations in a Long-Range Ising Model Under Adiabatic Driving
Santanu Dhara, Suhas Gangadharaiah

TL;DR
This paper investigates how long-range interactions and noise influence defect formation, correlations, and spin dynamics in an exactly solvable long-range transverse-field Ising model during adiabatic driving.
Contribution
It provides a detailed analysis of noise effects on defect density, correlations, and mode contributions in a long-range Ising model, highlighting differences from short-range systems.
Findings
Defect density scales as τ_Q^{-1/2} in noiseless case
Long-range interactions increase defect density without noise, but suppress it with noise
Correlations exhibit Gaussian and exponential decay patterns depending on conditions
Abstract
We study an exactly solvable long-range (LR) transverse-field Ising model (TFIM) with a power-law decaying interaction characterized by a decay exponent {\alpha}. In the thermodynamic limit, the system is adiabatically driven in the presence of noise, from a paramagnetic phase with all spins down to one with all spins up. Our study examines the role of long-range interactions on the defect density, its distribution, and spin correlations, comparing noisy and noiseless scenarios. In the noiseless case, within the long-range regime, the steady-state properties are primarily influenced by modes near the k = {\pi} region. However, in the presence of noise, the dominant contributions shift to the modes near k = 0. This differs from the SR model, where previous studies have shown that modes around k = {\pi}/2 play a significant role under noisy conditions. In the absence of noise, defect…
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Taxonomy
TopicsTheoretical and Computational Physics · Advancements in Semiconductor Devices and Circuit Design
