Nonvolatile Cryogenic Phase Slip Memory with Single-Shot Readout

TL;DR

This paper introduces a cryogenic phase slip memory device that uses a superconducting loop and resonator, achieving high-fidelity single-shot readout in 25 ns, suitable for ultra-fast, low-power computing.

Contribution

The work presents a novel, simple device design and measurement technique for phase slip memory with high readout fidelity and rapid measurement, addressing previous inefficiencies.

Findings

Readout fidelity of 99.698%

Active measurement time of 25 ns

Potential for ultra-fast cryogenic memory applications

Abstract

The demand for cryogenic memory components is driven by the need for ultra-fast, low-power, and highly reliable computing systems. Phase slip-based devices promise to fulfill all these requirements, with potential applications in both classical and quantum information processing. However, previous implementations have faced challenges due to inefficient writing and readout schemes. In this work, we address these limitations with a simple device design and measurement techniques inspired by circuit quantum electrodynamics. We present a memory element that stores information in the winding of a high-kinetic inductance superconducting loop, inductively coupled to a coplanar waveguide resonator. Using single-shot measurements, we achieve a readout fidelity of 99.698\% with an active measurement time of just 25 ns.