Thermal noise induced probability switching in magnetic tunnel junction based on spin-circuit simulation

TL;DR

This paper uses spin-circuit simulation to analyze how thermal noise influences probability switching in magnetic tunnel junctions, revealing effects on switching behavior for various pulse durations.

Contribution

It introduces a simulation model incorporating thermal noise effects on MTJ switching, aiding future circuit design involving MTJ devices.

Findings

Thermal noise affects switching probability for pulses >10 ns.

No switching observed for pulses <1 ns due to precessional switching.

Mixed switching behavior occurs between 1 ns and 10 ns.

Abstract

The probability switching characteristics in spin transfer torque magnetic tunnel junctions (STT-MTJs) are simulated by considering thermal noise using a spin-circuit module. Thermal noise significantly affects the probability switching for pulse durations exceeding 10 ns, while no probability switching properties are observed for pulses shorter than 1 ns due to the precessional switching. For pulse durations between 1 ns and 10 ns, the occurrence of mixed probability and abrupt switching suggests that thermal noise partially influences the switching properties. These results demonstrate the effectiveness of our simulation model in capturing the MTJ properties under the influence of thermal noise. The spin-circuit module used in this study lays the groundwork for future circuit system designs utilizing MTJ devices, such as true random number generators and neural network computing.