Muon tagging with Flash ADC waveform baselines
D. H. Lee, M. K. Cheoun, J. H. Choi, J. Y. Choi, T. Dodo, J. Goh, M. Harada, S. Hasegawa, W. Hwang, T. Iida, H. I. Jang, J. S. Jang, K. K. Joo, D. E. Jung, S. K. Kang, Y. Kasugai, T. Kawasaki, E. M. Kim, E. J. Kim, S. B. Kim, S. Y. Kim, H. Kinoshita, T. Konno, C. Little

TL;DR
This paper introduces a novel muon tagging method using Flash ADC waveform baseline analysis in the JSNS1 experiment, achieving over 99.8% rejection of Michel electrons without additional veto detectors.
Contribution
The paper presents an innovative waveform-based muon tagging technique that significantly improves background rejection in over-ground neutrino experiments.
Findings
Over 99.8% Michel electron rejection achieved
Method applicable to similar detector configurations
Enhances background rejection without veto detectors
Abstract
This manuscript describes an innovative method to tag the muons using the baseline information of the Flash ADC (FADC) waveform of PMTs in the JSNS1 (J-PARC Sterile Neutrino Search at J-PARC Spallation Neutron Source) experiment. This experiment is designed for the search for sterile neutrinos, and a muon tagging is an essential key component for the background rejection since the detector of the experiment is located over-ground, where is the 3rd floor of the J-PARC Material and Life experimental facility (MLF). Especially, stopping muons inside the detector create the Michel electrons, and they are important background to be rejected. Utilizing this innovative method, more than 99.8% of Michel electrons can be rejected even without a detector veto region. This technique can be employed for any experiments which uses the similar detector configurations.
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Taxonomy
TopicsNeutrino Physics Research · Particle Detector Development and Performance · Radiation Detection and Scintillator Technologies
