Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner

TL;DR

This paper presents a novel method for estimating material reflectance, transmittance, and opacity from any flatbed scanner image, overcoming previous limitations of uniform illumination assumptions and enabling high-resolution, accurate material capture.

Contribution

It introduces a new intrinsic image decomposition approach that works with any flatbed scanner, extending single-image material capture to include opacity and transmittance estimation.

Findings

Accurately removes shading and specularity from scanner images.

Improves the quality of material appearance estimation for various materials.

Enables high-resolution, cost-effective material capture with standard flatbed scanners.

Abstract

Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy