No time for surface charge: how bulk conductivity hides charge patterns from KPFM in contact-electrified surfaces
Felix Pertl, Isaac C.D. Lenton, Tobias Cramer, and Scott Waitukaitis

TL;DR
This study reveals that bulk conductivity in contact-electrified surfaces causes rapid charge decay, making stationary KPFM measurements unreliable for detecting charge patterns in most insulators.
Contribution
The paper demonstrates that bulk conductivity leads to fast charge decay, challenging the validity of stationary KPFM studies for charge pattern detection in insulators.
Findings
Charge decay times are shorter than KPFM scan times in good insulators.
Bulk conductivity explains the rapid charge decay observed.
Surface conductivity is ruled out as the primary cause of charge decay.
Abstract
Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact electrification, using an tiny tip to image voltages caused by transferred charge. It has been used in stationary studies focused on finding patterns (e.g. heterogeneity) in transferred charge, but also in dynamic studies aimed at understanding how charge escapes. Here, we show that the charge dynamics in all but the very best insulators are too fast for patterns found in stationary studies to be meaningful. Using a custom-built system, we are able to quickly (~30 s) transfer samples from our contact-charging apparatus to the atomic force microscopy (AFM). For materials at the lower end of `good insulators', we see potential decay that is shorter than the timescale of a typical KPFM scan (~10 minutes). We develop a minimal model to explain this decay based on bulk conductivity, and show that the measured…
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Taxonomy
TopicsAdvanced Sensor and Energy Harvesting Materials · Advanced Memory and Neural Computing · Conducting polymers and applications
