Error-mitigated entanglement-assisted quantum process tomography

TL;DR

This paper introduces an error-mitigated entanglement-assisted quantum process tomography method that improves the accuracy of quantum process characterization on noisy intermediate-scale quantum devices by reducing errors and resource requirements.

Contribution

It presents a novel EM-EAPT framework combining entanglement and error mitigation techniques for more robust quantum process tomography.

Findings

Achieved 98.1% fidelity for CNOT gate after error mitigation.

Demonstrated improved accuracy over non-mitigated methods.

Validated on superconducting quantum processors with two- and three-qubit processes.

Abstract

In the era of noisy intermediate-scale quantum computing, it is of crucial importance to verify quantum processes and extract information. Quantum process tomography is a typical approach, however, both resource-intensive and vulnerable to state preparation and measurement errors. Here, we propose an error-mitigated entanglement-assisted quantum process tomography (EM-EAPT) framework to address these limitations. By leveraging a maximally entangled state to reduce state preparation complexity and integrating error mitigation techniques, our method significantly enhances robustness against SPAM errors. Experimental validation on a superconducting processor demonstrates the efficacy of EM-EAPT for two-qubit and three-qubit quantum processes. Results show more accurate average gate fidelities close to the realistic estimation, achieving 98.1$\pm$ 0.03% for a CNOT gate and 88.1%$\pm$ 0.04% for a cascaded CNOT process after error mitigation, compared to non-mitigated implementations. This work advances practical quantum verification tools for NISQ devices, enabling higher-fidelity characterization of quantum processes under realistic noise conditions.