Sample Motion for Structured Illumination Fluorescence Microscopy

TL;DR

This paper introduces a novel SIM technique that leverages inherent sample motion with speckle illumination to achieve super-resolution, reducing the need for multiple patterned images and enabling simpler experimental setups.

Contribution

The method uniquely combines sample motion with speckle illumination to encode super-resolution information, simplifying structured illumination microscopy procedures.

Findings

Successful simulation validation of the method.

Experimental demonstration confirming feasibility.

Enhanced resolution achieved with fewer images.

Abstract

Structured illumination microscopy (SIM) uses a set of images captured with different illumination patterns to computationally reconstruct resolution beyond the diffraction limit. Here, we propose an alternative approach using a single speckle illumination pattern and relying on inherent sample motion to encode the super-resolved information in multiple raw images. From a set of raw fluorescence images captured as the sample moves, we jointly estimate both the sample motion and the super-resolved image. We demonstrate the feasibility of the proposed method both in simulation and in experiment.