Dynamically reconfigurable multi-wavelength interferometry
Leonard Vossgrag, Annelie Schiller, Tobias Seyler, Markus Fratz,, Alexander Bertz, Daniel Carl, Ingo Breunig

TL;DR
This paper introduces a fast, reconfigurable light source for multi-wavelength interferometry using electro-optic modulation, enabling adaptable, high-resolution measurements of complex surfaces in industrial environments.
Contribution
It presents a novel electro-optic single-sideband modulation technique for generating arbitrary synthetic wavelengths with rapid switching, enhancing multi-wavelength interferometry's flexibility and practicality.
Findings
Synthetic wavelengths from centimeters to meters generated reliably.
Switching times below 30 milliseconds achieved.
Enables dynamic adaptation to complex surfaces in real-world settings.
Abstract
Single-wavelength interferometry achieves high resolution for smooth surfaces but struggles with rough, industrially relevant ones due to limited unambiguous measuring range and speckle effects. Multi-wavelength interferometry addresses these challenges by using synthetic waveleths, enabling a balance between extended measurement range and resolution by combining several synthetic wavelengths. This approach holds immense potential for diverse industrial applications, yet it remains largely untapped due to the lack of suitable light sources. Existing solutions are constrained by limited flexibility in synthetic-wavelength generation and slow switching speeds. We demonstrate a light source for multi-wavelength interferometry based on electro-optic single-sideband modulation. It reliably generates synthetic wavelengths with arbitrary values from centimeters to meters and switching times…
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Taxonomy
TopicsOptical measurement and interference techniques · Advanced Measurement and Metrology Techniques · Advanced Optical Sensing Technologies
