Exploring Few-Shot Defect Segmentation in General Industrial Scenarios with Metric Learning and Vision Foundation Models
Tongkun Liu, Bing Li, Xiao Jin, Yupeng Shi, Qiuying Li, Xiang Wei

TL;DR
This paper explores few-shot defect segmentation in diverse industrial scenarios using metric learning and vision foundation models, introducing a new dataset and benchmark, and evaluating various methods including SAM2.
Contribution
It introduces a new real-world dataset and comprehensive benchmark for few-shot defect segmentation across diverse industrial scenarios, and systematically evaluates the effectiveness of VFMs and proposes a novel feature matching method.
Findings
VFMs outperform meta-learning methods in FDS tasks
SAM2 is highly effective in video mode for defect segmentation
Proposed feature matching method improves segmentation efficiency
Abstract
Industrial defect segmentation is critical for manufacturing quality control. Due to the scarcity of training defect samples, few-shot semantic segmentation (FSS) holds significant value in this field. However, existing studies mostly apply FSS to tackle defects on simple textures, without considering more diverse scenarios. This paper aims to address this gap by exploring FSS in broader industrial products with various defect types. To this end, we contribute a new real-world dataset and reorganize some existing datasets to build a more comprehensive few-shot defect segmentation (FDS) benchmark. On this benchmark, we thoroughly investigate metric learning-based FSS methods, including those based on meta-learning and those based on Vision Foundation Models (VFMs). We observe that existing meta-learning-based methods are generally not well-suited for this task, while VFMs hold great…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Welding Techniques and Residual Stresses · Manufacturing Process and Optimization
