Probe position determination with multichannel I-V measurements in a two-dimensional sheet$\colon$ Computational method and mathematical analysis

TL;DR

This paper introduces a novel electrical signal-based method for accurately determining probe positions in multi-probe measurements of two-dimensional materials, eliminating the need for microscopes and enabling versatile experimental conditions.

Contribution

The study presents a new computational and mathematical approach for probe position determination using electrical signals, improving flexibility and precision in 2D material characterization.

Findings

Enables precise probe positioning without microscopes

Works under various temperature and pressure conditions

Simplifies integration of multi-probe systems into devices

Abstract

Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the electrical conductivity of such thin films and surfaces. Precise determination of multi-probe positions is crucial for accurate characterization of the conductance. However, traditional methods that use microscopes for determining multi-probe positions often impose significant constraints on experimental setups. In some cases, installing a microscope is not even feasible. Therefore, in this study, we propose a novel method to determine probe positions using electrical signals from the probes. This method enables precise determination of probe positions using a reference sheet and reference probes, even at low or high temperatures and under ultra-high vacuum or high-pressure conditions. The proposed method simplifies the integration of microscale multi-probe measurement systems into various devices, thereby advancing research on thin films and surfaces.