Universal scaling of electrostatic effects of a curved counter-electrode on the emitter field enhancement
Thiago A. de Assis, Fernando F. Dalll'Agnol

TL;DR
This paper presents a universal scaling law for how the curvature of a counter-electrode affects the field enhancement factor of nanoemitters, explaining discrepancies in experimental measurements.
Contribution
It introduces a universal scaling function relating emitter field enhancement to counter-electrode curvature and gap size, advancing understanding of electrostatic effects in nanoemission.
Findings
Universal scaling law for field enhancement factor derived
Scaling function depends on ratio R/d_gap with different regimes
Explains underestimation of gamma in experimental measurements
Abstract
Experiments on field electron emission from single-tip nanoemitters have typically been carried out using a counter-electrode with a finite curvature radius , positioned at a distance from the emitter's apex. The effects of the counter-electrode's curvature on the apex field enhancement factor () of the emitter are still not understood. In this Letter, we theoretically explore how the apex field enhancement factor of an emitter, represented by a hemisphere on a cylindrical post (HCP) with apex radius nm, is influenced by the curvature of a spherical-shaped counter-electrode. Importantly, our results show that for HCPs with sharpness aspect ratios typically between and , there is a universal scaling such that , where represents the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsElectrochemical Analysis and Applications
