Ultra-sensitive integrated circuit sensors based on high-order nonHermitian topological physics

TL;DR

This paper introduces a new class of integrated circuit sensors leveraging high-order non-Hermitian topological physics, achieving exponential sensitivity growth and robustness, with practical fabrication and experimental validation.

Contribution

The paper presents the first experimental demonstration of ultra-sensitive sensors based on high-order non-Hermitian topological physics in standard CMOS technology.

Findings

Sensitivity less than 0.001fF verified experimentally

Sensors exhibit exponential frequency shift growth with device size

Sensors are robust against disorders

Abstract

High-precision sensors are of fundamental importance in modern society and technology.Although numerous sensors have been developed, obtaining sensors with higher levels of sensitivity and stronger robustness has always been expected. Here, we propose theoretically and demonstrate experimentally a novel class of sensors with superior performances based on exotic properties of highorder non-Hermitian topological physics. The frequency shift induced by perturbations for these sensors can show an exponential growth with respect to the size of the device, which can well beyond the limitations of conventional sensors. The fully integrated circuit chips have been designed and fabricated in a standard 65nm complementary metal oxide semiconductor process technology. The sensitivity of systems not only less than 0.001fF has been experimentally verified, they are also robust against disorders.Our proposed ultra-sensitive integrated circuit sensors can possess a wide range of applications in various fields and show an exciting prospect for next-generation sensing technologies.