One-dimensional confined Rashba states in a two-dimensional Si$_{2}$Bi$_{2}$ induced by vacancy line defects
Arif Lukmantoro, Edi Suprayoga, Moh. Adhib Ulil Absor

TL;DR
This study demonstrates the emergence of one-dimensional Rashba states in a two-dimensional Si₂Bi₂ monolayer with vacancy line defects, revealing potential for spintronic applications due to their spin properties and symmetry-enforced characteristics.
Contribution
The paper introduces a novel way to induce 1D Rashba states in 2D materials via vacancy line defects, combining density-functional calculations and symmetry analysis to understand their properties.
Findings
VLDs induce 1D confined defect states near the Fermi level.
Observed spin-split bands with collinear spin polarization perpendicular to VLDs.
Symmetry analysis explains the enforcement of Rashba states by the $C_s$ point group.
Abstract
Advanced defect engineering techniques have enabled the creation of unique quantum phases from pristine materials. One-dimensional (1D) atomic defects in low-dimensional systems are particularly intriguing due to their distinct quantum properties, such as 1D Rashba states that allow for the generation of nondissipative spin currents, making them ideal for spintronic devices. Using density-functional calculations and model-based symmetry analysis, we report the emergence of 1D Rashba states in a two-dimensional SiBi monolayer (ML) with vacancy line defects (VLDs). We show that introducing VLDs in the SiBi ML induces 1D confined defect states near the Fermi level, which are strongly localized along the extended defect line. Notably, we observed 1D Rashba spin-split bands in these defect states with significant spin splitting originating mainly from the strong …
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsSurface and Thin Film Phenomena · Topological Materials and Phenomena · Advanced Materials Characterization Techniques
