Drift time calibration of the ultra-low material budget GEM-based TPC for MIXE
X. Zhao, M. W. Heiss, F. Garcia, B. J. Zeh, I. Briki, K. J. Fl\"othner, G. Janka, L. Scharenberg, B. Banto-Oberhauser, H. M\"uller, S. Biswas, T. Prokscha, A. Amato

TL;DR
This paper presents a calibration method for the drift time in a GEM-based TPC used in the MIXE technique, enhancing depth-resolved elemental analysis with high precision.
Contribution
It introduces a novel drift time calibration approach using a fiber detector and SiPM, improving spatial accuracy in the TPC for MIXE applications.
Findings
Achieved permille-level drift velocity calibration accuracy.
Enhanced depth resolution in elemental analysis.
Validated the calibration method with experimental data.
Abstract
Muon-Induced X-ray Emission (MIXE) is a non-destructive analytical technique that leverages negative muons to probe elemental and isotopic compositions by detecting characteristic muonic X-rays emitted during atomic cascades and gamma rays from nuclear capture processes. By controlling the muon beam momentum, MIXE enables depth-resolved analysis, spanning microns to centimeters, making it ideal for studying compositional variations in fragile, valuable, or operando samples. To enhance its capabilities, we integrated a twin Time Projection Chamber (TPC) tracker with Gas Electron Multiplier (GEM) amplification stages, allowing precise measurement of muon trajectories. A custom-built fiber detector with scintillating fibers and a Silicon Photomultiplier (SiPM) provides permille-level accuracy in drift velocity calibration, essential for accurate spatial reconstruction. This advanced setup…
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Taxonomy
TopicsAdvancements in Photolithography Techniques · Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques
