Light-based Chromatic Aberration Correction of Ultrafast Electron Microscopes
Marius Constantin Chirita Mihaila, Neli La\v{s}tovi\v{c}kov\'a Streshkova, Martin Koz\'ak

TL;DR
This paper introduces a theoretical method to correct chromatic aberrations in ultrafast electron microscopes by using space- and time-dependent phase modulation with a shaped pulsed ponderomotive lens, significantly improving electron beam focus.
Contribution
It presents a novel theoretical technique for chromatic aberration correction in ultrafast electron microscopes using phase modulation with a pulsed ponderomotive lens.
Findings
Chromatic aberration reduced by up to a factor of seven.
The method enables advanced wavefront shaping of electrons.
The approach is based on space- and time-dependent phase modulation.
Abstract
We propose and theoretically demonstrate a technique that allows one to compensate for chromatic aberrations of traditional electron lenses in ultrafast electron microscopes. The technique is based on space- and time-dependent phase modulation of a pulsed electron beam using interaction with a shaped pulsed ponderomotive lens. The energy-selective focal distance is reached by combining the electron temporal chirp with the time-dependent size of the effective potential, with which the electrons interact. As a result, chromatic aberration can be reduced by up to a factor of seven. This approach paves the way for advanced transverse and longitudinal wavefront shaping of electrons in free space.
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques
