Approaching the quantum-limited precision in frequency-comb-based spectral interferometry for length measurements
Yoon-Soo Jang, Heulbi Ahn, Sunghoon Eom, Jungjae Park, and Jonghan Jin

TL;DR
This paper demonstrates near-quantum-limited precision in frequency-comb-based spectral interferometry for length measurements, achieving sub-nanometer accuracy and practical applications like vibration and eavesdropping detection.
Contribution
It reports the first measurement of spectral interferometry approaching the quantum limit with sub-nanometer precision, advancing length metrology technology.
Findings
Achieved 0.67 nm measurement precision at 25 us averaging time
Measured sensitivity of 4.5×10^-12 m/Hz^1/2 close to quantum limit
Demonstrated practical applications in vibration and eavesdropping detection
Abstract
Over the last two decades, frequency combs have brought breakthroughs in length metrology with traceability to length standards. In particular, frequency-comb-based spectral interferometry is regarded as a promising technology for next-generation length standards. However, to achieve this, the nanometer-level precision inherent in laser interferometer is required. Here, we report distance measurements by a frequency-comb-based spectral interferometry with sub-nm precision close to a standard quantum limit. The measurement precision was confirmed as 0.67 nm at an averaging time of 25 us. The measurement sensitivity was found to be 4.5 10-12m/Hz1/2, close to the quantum-limit. As a practical example of observing precise physical phenomena, we demonstrated measurements of acoustic-wave-induced vibration and laser eavesdropping. Our study will be an important step toward the practical…
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Taxonomy
TopicsAdvanced Fiber Laser Technologies · Advanced Measurement and Metrology Techniques · Advanced Fiber Optic Sensors
