Ultrafast pulsed laser evaluation of Single Event Transients in opto-couplers
Kavin Dave, Aditya Mukherjee, Hari Shanker Gupta, Deepak Jain, Shalabh, Gupta

TL;DR
This paper presents a new testing setup using a 1064 nm fiber laser to evaluate single event transients in optocouplers, demonstrating for the first time the occurrence of SETs in the 4N35 optocoupler.
Contribution
Introduction of a novel laser-based testing method for detecting SETs in optocouplers, enabling first-time observation of SETs in the 4N35 device.
Findings
SETs observed in 4N35 optocoupler
Development of a laser testing facility
First demonstration of SETs in this component
Abstract
We build a 1064 nm fiber laser system-based testing facility for emulating SETs in different electronics components and ICs. Using these facilities, we tested the 4N35 optocoupler to observe SETs for the first time.
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Taxonomy
TopicsRadiation Effects in Electronics · Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices
