On-the-Spot Loading of Single-Atom Traps
Mark IJspeert, Naomi Holland, Benjamin Yuen, Axel Kuhn

TL;DR
This paper demonstrates that increasing the depth of static optical dipole traps significantly improves the loading efficiency and lifetime of single-atom traps, achieving nearly 80% filling ratio without atom rearrangement.
Contribution
It introduces a method to enhance single-atom trap loading and lifetime by increasing trap depth, enabling high filling ratios without atom rearrangement.
Findings
Achieved a trap lifetime of 7.9 seconds.
Demonstrated a filling ratio of 79% without rearrangement.
Extended loading times from 2.1 seconds to improve efficiency.
Abstract
Reconfigurable arrays of trapped single atoms are an excellent platform for the simulation of many-body physics and the realisation of high-fidelity quantum gates. The confinement of atoms is often achieved with focussed laser beams acting as optical dipole-force traps that allow for both static and dynamic positioning of atoms. In these traps, light-assisted collisions -- enhancing the two-atom loss rate -- ensure that single atom occupation of traps can be realised. However, the time-averaged probability of trapping a single atom is limited to when loading directly from a surrounding cloud of laser-cooled atoms, preventing deterministic filling of large arrays. In this work, we demonstrate that increasing the depth of a static, optical dipole trap enables the transition from fast loading on a timescale of s to an extended trap lifetime of s. This method…
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Taxonomy
TopicsMolecular Junctions and Nanostructures · Advanced Chemical Physics Studies · Graphene research and applications
