Time-Correlated Single-Photon Counting for versatile longitudinal diagnostics at the MAX IV Laboratory storage rings
Miriam Brosi, Johann Schmand, Jonas Breunlin, Francesca Curbis

TL;DR
This paper demonstrates the implementation of Time-Correlated Single-Photon Counting (TCSPC) at MAX IV to non-invasively measure electron bunch profiles, enhancing diagnostics for synchrotron light source operation.
Contribution
It introduces a TCSPC-based diagnostic tool integrated into MAX IV's control system for real-time longitudinal beam profile measurements.
Findings
Successful measurement of bunch length and profiles.
Enhanced diagnostic capabilities in presence of Landau cavities.
Real-time monitoring integrated into control system.
Abstract
Precise diagnostic on the electron beam parameters is a very valuable tool and essential in the operation of synchrotron light sources. One possible option is to employ the emitted synchrotron radiation for non-destructive measurements. A tool, which has been used in many ring based synchrotron light sources is Time-Correlated Single-Photon Counting (TCSPC). It allows to measure the arrival time distribution of the emitted photons and by that reveals the filling pattern, i.e., the charge distribution onto the electron bunches stored in the storage ring. At MAX IV, two TCSPC setups were installed and the analysis was developed further to also allow for the measurement of the longitudinal profiles of the individual bunches. The analysis is available as a Tango device in the accelerator control system and continuously provides, for example, the bunch length of each bunch as well as the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Optical Sensing Technologies · Advanced X-ray and CT Imaging · Integrated Circuits and Semiconductor Failure Analysis
