Predicting IoT Device Vulnerability Fix Times with Survival and Failure Time Models
Carlos A Rivera A, Xinzhang Chen, Arash Shaghaghi, Gustavo, Batista, Salil Kanhere

TL;DR
This paper introduces a survival analysis framework using XGBoost to predict IoT device vulnerability fix times, aiding organizations in proactive patch management and cybersecurity planning.
Contribution
The study presents a novel survival analysis model tailored for IoT vulnerabilities, integrating diverse data sources and demonstrating accurate prediction of fix times.
Findings
The model accurately predicts IoT vulnerability fix times.
Data from VulDB and NVD are highly effective for predictions.
Twitter trend data adds minimal benefit.
Abstract
The rapid integration of Internet of Things (IoT) devices into enterprise environments presents significant security challenges. Many IoT devices are released to the market with minimal security measures, often harbouring an average of 25 vulnerabilities per device. To enhance cybersecurity measures and aid system administrators in managing IoT patches more effectively, we propose an innovative framework that predicts the time it will take for a vulnerable IoT device to receive a fix or patch. We developed a survival analysis model based on the Accelerated Failure Time (AFT) approach, implemented using the XGBoost ensemble regression model, to predict when vulnerable IoT devices will receive fixes or patches. By constructing a comprehensive IoT vulnerabilities database that combines public and private sources, we provide insights into affected devices, vulnerability detection dates,…
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Taxonomy
TopicsSoftware Reliability and Analysis Research · Software System Performance and Reliability · IoT and Edge/Fog Computing
