Stochastic Thermodynamics of the Two-Dimensional Model of Transistors

TL;DR

This paper models charge transport in two-dimensional transistors using stochastic differential equations, demonstrating the fluctuation theorem and the impact of geometry on transport, achieving realistic signal amplification.

Contribution

It introduces a stochastic two-dimensional model of transistors that incorporates thermodynamics and microreversibility, providing insights into transport behavior and signal amplification.

Findings

Fluctuation theorem holds in the model.

Geometry significantly influences transport behavior.

Achieves signal amplification comparable to real transistors.

Abstract

We adopt a stochastic approach to study the charge transport in transistors. In this approach, the hole and electron densities are ruled by diffusion-reaction stochastic partial differential equations satisfying local detailed balance condition. The electric field is supposed to be concentrated in very narrow regions around the two junctions and is also approximated to be static. In this way, not only the laws of electricity, thermodynamics, and microreversibility is consistent within this approach, but also the transistor can be easily modeled as a two-dimensional system. We perform the full counting statistics of the two coupled currents, and the fluctuation theorem is shown to hold. Moreover, we show that the geometric shape of the transistor exert great influence on the transport behavior. By modeling the transistor in two dimensions, the signal-amplification factor up to about $164$ can be achieved, which is comparable to the typical value of realistic transistors in industry.