Modulo Sampling: Performance Guarantees in The Presence of Quantization
Neil Irwin Bernardo, Shaik Basheeruddin Shah, Yonina C. Eldar

TL;DR
This paper analyzes the performance of modulo ADCs with quantization, providing conditions under which they outperform conventional ADCs in terms of MSE, and introduces algorithms for signal recovery with and without additional folding information.
Contribution
The paper introduces new recovery algorithms for modulo ADCs, establishes performance guarantees under specific oversampling and quantization conditions, and compares their MSE performance to conventional ADCs.
Findings
Modulo ADC with folding info achieves lower MSE than conventional ADC.
Oversampling factor > 3 and resolution > 3 bits suffice for effective unfolding.
Modulo ADC's MSE scales as 1/OF^3, outperforming the 1/OF scaling of conventional ADC.
Abstract
In this paper, we investigate the relationship between the dynamic range and quantization noise power in modulo analog-to-digital converters (ADCs). Two modulo ADC systems are considered: (1) a modulo ADC which outputs the folded samples and an additional 1-bit folding information signal, and (2) a modulo ADC without the 1-bit information. A recovery algorithm that unfolds the quantized modulo samples using the extra 1-bit folding information is analyzed. Using the dithered quantization framework, we show that an oversampling factor of and a quantizer resolution of are sufficient conditions to unfold the modulo samples. When these conditions are met, we demonstrate that the mean squared error (MSE) performance of modulo ADC with an extra 1-bit folding information signal is better than that of a conventional ADC with the same number of bits used for amplitude…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsFault Detection and Control Systems · Advanced Statistical Process Monitoring · Machine Learning and Algorithms
