Oblique rotational axis detection using elliptical optical vortex based on rotational Doppler effect

TL;DR

This paper introduces a novel optical method using elliptical optical vortices to accurately detect the tilt angle of a rotating object’s axis by analyzing the rotational Doppler spectral distribution, addressing oblique incidence effects.

Contribution

The study reveals the quantitative relationship between tilt angle, ellipticity, and the rotational Doppler effect, and proposes a new approach for tilt angle measurement using EOV.

Findings

Established the relationship between tilt angle and spectral distribution.

Demonstrated accurate tilt angle measurement using EOV.

Addressed spectrum broadening effects due to oblique incidence.

Abstract

The rotational Doppler effect (RDE) of structured light carrying orbital angular momentum (OAM) has attracted widespread attention for applications in optical sensors and OAM spectrum detection. These studies, however, based on RDE, are mostly focused on the motion parameters of rotating objects; other equally important attitude characteristics, e.g., the tilt angle of the axis of rotation, have rarely been considered. We observed an interesting phenomenon in the experiments: the rotational Doppler spectral distribution varies with the ellipticity of the elliptical optical vortex (EOV) and the tilt angle between the rotational axis and optical axis, which inspired us to wonder if it is possible to detect oblique rotational axis or compensate the rotational Doppler broadening effect induced by oblique incidence by utilizing the EOV. Here, we reveal the RDE quantitative relationship with tilt angle and ellipticity for the first time and report a novel approach for tilt angle measurement. By employing a series of EOV with periodically varying ellipticity to illuminate a rotating object and analyze the time-frequency spectral distribution of scattered light associated with ellipticity and tilt angle, the tilt angle can be acquired accurately based on the specific relationship between the tilt angle and ellipticity of the EOV. Furthermore, the spectrum broadening effect arising from oblique incidence in the actual scenario may be addressed through our scheme. The method may find applications in industrial manufacturing and target attitude measurement, and our results provide new insights for obtaining more information about objects.