MetricDepth: Enhancing Monocular Depth Estimation with Deep Metric Learning
Chunpu Liu, Guanglei Yang, Wangmeng Zuo, Tianyi Zan

TL;DR
MetricDepth introduces a novel deep metric learning approach with differential-based sample identification and multi-range negative sample strategy to significantly improve monocular depth estimation accuracy across diverse datasets.
Contribution
This paper presents a new method, MetricDepth, that adapts deep metric learning for monocular depth estimation by designing differential-based sample identification and a multi-range negative sample strategy.
Findings
Enhanced depth estimation accuracy across multiple datasets.
Effective feature regularization through differential-based sample identification.
Versatile performance across various model architectures.
Abstract
Deep metric learning aims to learn features relying on the consistency or divergence of class labels. However, in monocular depth estimation, the absence of a natural definition of class poses challenges in the leveraging of deep metric learning. Addressing this gap, this paper introduces MetricDepth, a novel method that integrates deep metric learning to enhance the performance of monocular depth estimation. To overcome the inapplicability of the class-based sample identification in previous deep metric learning methods to monocular depth estimation task, we design the differential-based sample identification. This innovative approach identifies feature samples as different sample types by their depth differentials relative to anchor, laying a foundation for feature regularizing in monocular depth estimation models. Building upon this advancement, we then address another critical…
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Taxonomy
TopicsAdvanced Vision and Imaging · Industrial Vision Systems and Defect Detection · Optical measurement and interference techniques
