Quality Assurance and Quality Control of the $26~\text{m}^2$ SiPM production for the DarkSide-20k dark matter experiment

TL;DR

This paper details the quality assurance and control procedures for producing SiPM wafers used in the DarkSide-20k dark matter detector, ensuring high yield and performance at cryogenic temperatures.

Contribution

It introduces a comprehensive QA/QC plan for SiPM wafer production, achieving a yield surpassing initial specifications for a large-scale dark matter experiment.

Findings

94% of wafers tested as of March 2025

Wafer yield of 93.2% exceeds 80% target

SiPM characteristics measured at 77 K

Abstract

DarkSide-20k is a novel liquid argon dark matter detector currently under construction at the Laboratori Nazionali del Gran Sasso (LNGS) of the Istituto Nazionale di Fisica Nucleare (INFN) that will push the sensitivity for Weakly Interacting Massive Particle (WIMP) detection into the neutrino fog. The core of the apparatus is a dual-phase Time Projection Chamber (TPC), filled with \SI{50} {tonnes} of low radioactivity underground argon (UAr) acting as the WIMP target. NUV-HD-cryo Silicon Photomultipliers (SiPM)s designed by Fondazione Bruno Kessler (FBK) (Trento, Italy) were selected as the photon sensors covering two $10.5~\text{m}^2$ Optical Planes, one at each end of the TPC, and a total of $5~\text{m}^2$ photosensitive surface for the liquid argon veto detectors. This paper describes the Quality Assurance and Quality Control (QA/QC) plan and procedures accompanying the production of FBK~NUV-HD-cryo SiPM wafers manufactured by LFoundry s.r.l. (Avezzano, AQ, Italy). SiPM characteristics are measured at 77~K at the wafer level with a custom-designed probe station. As of March~2025, 1314 of the 1400 production wafers (94% of the total) for DarkSide-20k were tested. The wafer yield is $93.2\pm2.5$\%, which exceeds the 80\% specification defined in the original DarkSide-20k production plan.