Calculating the I/O Cost of Linear Repair Schemes for RS Codes Evaluated on Subspaces via Exponential Sums
Zhongyan Liu, Jingke Xu, Zhifang Zhang

TL;DR
This paper introduces a method using exponential sums to calculate the I/O cost of linear repair schemes for Reed-Solomon codes, deriving bounds and designing schemes that optimize I/O and repair bandwidth.
Contribution
It presents a novel approach to compute Hamming weights via exponential sums, establishing lower bounds and constructing I/O-optimal repair schemes for RS codes with 2 or 3 parities.
Findings
Derived exact I/O cost bounds for specific RS code configurations.
Designed I/O-optimal repair schemes matching the bounds.
Achieved lower repair bandwidth for full-length RS codes with three parities.
Abstract
The I/O cost, defined as the amount of data accessed at helper nodes during the repair process, is a crucial metric for repair efficiency of Reed-Solomon (RS) codes. Recently, a formula that relates the I/O cost to the Hamming weight of some linear spaces was proposed in [Liu\&Zhang-TCOM2024]. In this work, we introduce an effective method for calculating the Hamming weight of such linear spaces using exponential sums. With this method, we derive lower bounds on the I/O cost for RS codes evaluated on a -dimensional subspace of with or parities. These bounds are exactly matched in the cases and or , via the repair schemes designed in this work. We refer to schemes that achieve the lower bound as I/O-optimal repair schemes. Additionally, we characterize the optimal repair bandwidth of I/O-optimal…
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Taxonomy
TopicsAdvancements in Photolithography Techniques · Semiconductor materials and devices · Copper Interconnects and Reliability
