Two direct sampling methods for an anisotropic scatterer with a conductive boundary

TL;DR

This paper introduces two novel direct sampling methods for reconstructing anisotropic scatterers with conductive boundaries using far-field or Cauchy data, validated through numerical experiments.

Contribution

First application of direct sampling methods to anisotropic scatterers with conductive boundaries in inverse shape problems.

Findings

Methods effectively recover scatterer shape from data.

Imaging functionals decay away from the scatterer.

Numerical results confirm theoretical predictions.

Abstract

In this paper, we consider the inverse scattering problem associated with an anisotropic medium with a conductive boundary condition. We will assume that the corresponding far--field pattern or Cauchy data is either known or measured. The conductive boundary condition models a thin coating around the boundary of the scatterer. We will develop two direct sampling methods to solve the inverse shape problem by numerically recovering the scatterer. To this end, we study direct sampling methods by deriving that the corresponding imaging functionals decay as the sampling point moves away from the scatterer. These methods have been applied to other inverse shape problems, but this is the first time they will be applied to an anisotropic scatterer with a conductive boundary condition. These methods allow one to recover the scatterer by considering an inner--product of the far--field data or the Cauchy data. Here, we will assume that the Cauchy data is known on the boundary of a region $\Omega$ that completely encloses the scatterer $D$. We present numerical reconstructions in two dimensions to validate our theoretical results for both circular and non-circular scatterers.