Characterisation of individual gates using twirling circuits

TL;DR

This paper introduces a deterministic method for characterising single-qubit gates using a novel twirling process that improves upon traditional randomized benchmarking, suitable for complex experimental setups.

Contribution

It presents a new twirling technique applied via fixed circuits, eliminating the need for averaging over random gates and enhancing gate analysis methods.

Findings

Improves accuracy of single-qubit gate characterisation.

Eliminates the need for averaging over random gates.

Compatible with multi-qubit control experimental setups.

Abstract

We present a method to characterise qubit gates. Utilising the supermap formalism, we create a scheme for deterministic single-qubit gate analysis. Our approach introduces a new twirling process that is applied directly through fixed circuits. This method removes the requirement to average over random gates. The results enhance randomised benchmarking techniques and are suitable for experimental setups with multi-qubit control, focusing on the precise characterisation of single-qubit gates.