BOSS: Blocking algorithm for optimizing shuttling scheduling in Ion Trap
Xian Wu, Chenghong Zhu, Jingbo Wang, Xin Wang

TL;DR
This paper introduces BOSS, a blocking algorithm designed to optimize shuttling operations in ion trap quantum computers, significantly reducing shuttles and improving overall device efficiency.
Contribution
The paper presents a novel blocking algorithm that enhances shuttling efficiency in ion traps, reducing shuttle counts by up to 96.1%, and incorporates realistic simulations for better fidelity and timing estimates.
Findings
Maximum reduction of 96.1% in shuttles used
Significant improvements in shuttling efficiency across applications
Simulations show higher fidelity and realistic execution times
Abstract
Ion traps stand at the forefront of quantum hardware technology, presenting unparalleled benefits for quantum computing, such as high-fidelity gates, extensive connectivity, and prolonged coherence times. In this context, we explore the critical role of shuttling operations within these systems, especially their influence on the fidelity loss and elongated execution times. To address these challenges, we have developed BOSS, an efficient blocking algorithm tailored to enhance shuttling efficiency. This optimization not only bolsters the shuttling process but also elevates the overall efficacy of ion trap devices. We experimented on multiple applications using two qubit gates up to 4000+ and qubits ranging from 64 to 78. Our method significantly reduces the number of shuttles on most applications, with a maximum reduction of 96.1%. Additionally, our investigation includes simulations of…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsReliability and Maintenance Optimization · Software Reliability and Analysis Research · Radiation Effects in Electronics
