One-step Fabrication of Sharp Platinum/Iridium Tips via Amplitude-Modulated Alternating-Current Electropolishing
Yuto Nishiwaki, Toru Utsunomiya, Shu Kurokawa, Takashi Ichii

TL;DR
This paper presents a simple, reproducible method for fabricating sharp platinum/iridium tips for scanning probe microscopy using amplitude-modulated AC electropolishing, enabling atomic-resolution imaging in various environments.
Contribution
The study introduces a novel amplitude-modulated AC electropolishing technique for producing high-quality, sharp Pt/Ir tips with consistent surface properties for advanced microscopy applications.
Findings
Tips with radius less than 100 nm were reproducibly fabricated.
The tips showed no O or Cl contamination on the surface.
The fabricated tips achieved atomic resolution in liquid environments.
Abstract
The platinum/iridium (Pt/Ir) alloy tip for scanning probe microscopy (SPM) was fabricated by amplitude-modulated alternating-current (AC) electropolishing. The clean tips with a radius of curvature less than 100 nm were reproducibly obtained by applying the sinusoidal voltage in the frequency () of with amplitude modulation by the sinusoidal wave in the modulation frequency () of in //acetone solution. The analyses by scanning electron microscopy with an energy-dispersive X-ray analyzer (SEM-EDX) and atom probe tomography (APT) showed that a uniform Pt/Ir alloy was exposed on the tip surface as a clean surface without O or Cl contamination. The STM imaging using the fabricated tip showed that it is more suitable for investigating rough surfaces than conventional as-cut tips and…
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Taxonomy
TopicsSemiconductor materials and devices · Nanofabrication and Lithography Techniques · Copper Interconnects and Reliability
