BDefects4NN: A Backdoor Defect Database for Controlled Localization Studies in Neural Networks
Yisong Xiao, Aishan Liu, Xinwei Zhang, Tianyuan Zhang, Tianlin Li,, Siyuan Liang, Xianglong Liu, Yang Liu, Dacheng Tao

TL;DR
This paper introduces BDefects4NN, a comprehensive database of backdoor-defected neural networks, enabling controlled localization studies to improve detection and repair of malicious model defects in critical AI systems.
Contribution
It presents the first backdoor defect database with labeled defects at neuron granularity, facilitating research on defect localization and mitigation in neural networks.
Findings
Limited effectiveness of existing fault localization criteria for backdoor defects
Backdoor models pose significant threats in autonomous driving and LLMs
Current defect localization techniques need improvement
Abstract
Pre-trained large deep learning models are now serving as the dominant component for downstream middleware users and have revolutionized the learning paradigm, replacing the traditional approach of training from scratch locally. To reduce development costs, developers often integrate third-party pre-trained deep neural networks (DNNs) into their intelligent software systems. However, utilizing untrusted DNNs presents significant security risks, as these models may contain intentional backdoor defects resulting from the black-box training process. These backdoor defects can be activated by hidden triggers, allowing attackers to maliciously control the model and compromise the overall reliability of the intelligent software. To ensure the safe adoption of DNNs in critical software systems, it is crucial to establish a backdoor defect database for localization studies. This paper addresses…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis · Adversarial Robustness in Machine Learning
