Influence of Critical Current Distribution on Operation, Quench Detection and Protection of HTS Pancake Coils

TL;DR

This paper uses 3D coupled electromagnetic and thermal simulations to analyze how critical current variations and defects in HTS pancake coils affect quench detection and protection strategies.

Contribution

It introduces a detailed simulation approach using the FiQuS tool to study the impact of critical current defects on coil stability and quench detection in HTS pancake coils.

Findings

Critical current defects can induce thermal runaway depending on their size and location.

Different defect scenarios require distinct quench detection strategies.

Simulation results inform better protection schemes for conduction-cooled HTS coils.

Abstract

High-temperature superconductor (HTS) coated conductors (CC) are often wound into pancake coils with electrical insulation in-between the turns. The copper terminals are used for current injection and conduction cooling. An inherent variation of the critical current along the CC length results from its manufacturing process. This variation causes non-uniform heat generation, particularly when the coil is operated at a high fraction of the nominal critical current or when large critical current defects are present. The temperature distribution resulting from the balance between cooling and heating, in combination with the magnetic field and critical current distributions, determines whether a thermal runaway occurs. Accurately predicting the level of critical current defects that can be tolerated during conduction-cooled operation is difficult and requires a 3D coupled electromagnetic and thermal simulation. This paper presents the results of simulations that are performed with the open-source Finite Element Quench Simulator (FiQuS) tool developed at CERN as part of the STEAM framework. The 3D coupled magnetodynamic-thermal simulations are based on the H-phi formulation and use thin shell approximations, a CC homogenization and conduction-cooling. The critical current (Ic) is varied along the CC length. The effect of a single defect specified as a reduction of Ic along the CC length is investigated in terms of the coil's ability to reach and maintain the operating conditions. The Ic and length of the defect that results in a thermal runaway are analyzed in terms of defect location. In addition, a classical 1D scenario with a quench heater is studied. Both the local defect and the heater cases are compared in terms of the voltage signal available for quench detection. These cases result in very different requirements for quench detection, and their implications are discussed.