Assessing data-driven predictions of band gap and electrical conductivity for transparent conducting materials
Federico Ottomano, John Y. Goulermas, Vladimir Gusev, Rahul Savani,, Michael W. Gaultois, Troy D. Manning, Hai Lin, Teresa P. Manzanera, Emmeline, G. Poole, Matthew S. Dyer, John B. Claridge, Jon Alaria, Luke M. Daniels, Su, Varma, David Rimmer, Kevin Sanderson

TL;DR
This paper develops a data-driven framework using machine learning to discover new transparent conducting materials, addressing data scarcity and evaluating the models' ability to find novel candidates beyond known compositions.
Contribution
The study introduces a unique experimental database and a bespoke evaluation scheme to assess ML models' effectiveness in discovering new TCMs from composition data.
Findings
ML models tend to identify TCMs similar to training data
ML can highlight previously overlooked candidate materials
The framework offers a systematic approach for TCM discovery
Abstract
Machine Learning (ML) has offered innovative perspectives for accelerating the discovery of new functional materials, leveraging the increasing availability of material databases. Despite the promising advances, data-driven methods face constraints imposed by the quantity and quality of available data. Moreover, ML is often employed in tandem with simulated datasets originating from density functional theory (DFT), and assessed through in-sample evaluation schemes. This scenario raises questions about the practical utility of ML in uncovering new and significant material classes for industrial applications. Here, we propose a data-driven framework aimed at accelerating the discovery of new transparent conducting materials (TCMs), an important category of semiconductors with a wide range of applications. To mitigate the shortage of available data, we create and validate unique…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Smart Materials for Construction
