Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy

TL;DR

This paper evaluates two analytical models for the s-SNOM probe to improve high-resolution spectroscopic imaging, validating their accuracy by retrieving the permittivity spectrum of dielectric samples.

Contribution

It introduces and compares two analytical models for the AFM tip in s-SNOM, assessing their effectiveness in permittivity spectrum retrieval.

Findings

Both models successfully retrieve the permittivity spectrum.

Model validation confirms the models' applicability for high-resolution spectroscopy.

The study enhances understanding of probe-sample interactions in s-SNOM.

Abstract

Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method.