Outliers resistant image classification by anomaly detection
Anton Sergeev, Victor Minchenkov, Aleksei Soldatov, Vasiliy Kakurin, Yaroslav Mazikov

TL;DR
This paper introduces a model combining classification and anomaly detection using metric learning to improve robustness of image classification in production monitoring, especially against outliers and environmental variations.
Contribution
It proposes a novel approach that integrates anomaly detection with classification via metric learning, addressing the challenge of unpredictable outliers in production environments.
Findings
Effective in detecting outliers and environmental variations
Compared multiple model architectures with promising results
Enhanced robustness of image classification in manual assembly monitoring
Abstract
Various technologies, including computer vision models, are employed for the automatic monitoring of manual assembly processes in production. These models detect and classify events such as the presence of components in an assembly area or the connection of components. A major challenge with detection and classification algorithms is their susceptibility to variations in environmental conditions and unpredictable behavior when processing objects that are not included in the training dataset. As it is impractical to add all possible subjects in the training sample, an alternative solution is necessary. This study proposes a model that simultaneously performs classification and anomaly detection, employing metric learning to generate vector representations of images in a multidimensional space, followed by classification using cross-entropy. For experimentation, a dataset of over 327,000…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnomaly Detection Techniques and Applications
