Modeling Extensive Defects in Metals through Classical Potential-Guided Sampling and Automated Configuration Reconstruction
Fei Shuang, Kai Liu, Yucheng Ji, Wei Gao, Luca Laurenti, Poulumi Dey

TL;DR
This paper introduces a new approach combining empirical potential-guided sampling and automated configuration reconstruction to develop machine learning interatomic potentials capable of accurately modeling extensive defects in metals, exemplified by tungsten.
Contribution
It presents a novel framework for creating highly accurate MLIPs for extensive metallic defects by leveraging defect genomes and automated configuration reconstruction techniques.
Findings
Developed an MLIP for tungsten that captures plastic mechanisms.
Enhanced modeling accuracy for extensive defects in crystalline materials.
Established a robust method for defect genome generation and configuration reconstruction.
Abstract
Extended defects such as dislocation networks and general grain boundaries are ubiquitous in metals, and accurately modeling these extensive defects is crucial for understanding their deformation mechanisms. Existing machine learning interatomic potentials (MLIPs) often fall short in adequately describing these defects, as their significant characteristic sizes exceed the computational limits of first-principles calculations. In this study, we address these challenges by establishing a comprehensive defect genome through empirical interatomic potential-guided sampling. To further enable accurate first-principles calculations on this defect genome, we have developed an automated configuration reconstruction technique. This method transforms defect atomic clusters into periodic configurations through precise atom insertion, utilizing Grand Canonical Monte Carlo simulations. These…
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Taxonomy
TopicsManufacturing Process and Optimization · Industrial Vision Systems and Defect Detection · Machine Learning in Materials Science
