MBL-CPDP: A Multi-objective Bilevel Method for Cross-Project Defect Prediction via Automated Machine Learning
Jiaxin Chen, Jinliang Ding, Kay Chen Tan, Jiancheng Qian, Ke Li

TL;DR
This paper introduces MBL-CPDP, a multi-objective bilevel optimization approach that automates and enhances cross-project defect prediction by optimizing ML pipelines and hyperparameters for better adaptability across diverse datasets.
Contribution
The paper proposes a novel multi-objective bilevel optimization framework for automated cross-project defect prediction, integrating feature selection, transfer learning, and ensemble methods.
Findings
MBL-CPDP outperforms five automated ML tools and 50 CPDP techniques.
It demonstrates superior adaptability across 20 diverse projects.
The approach effectively handles high-dimensional, heterogeneous data.
Abstract
Cross-project defect prediction (CPDP) leverages machine learning (ML) techniques to proactively identify software defects, especially where project-specific data is scarce. However, developing a robust ML pipeline with optimal hyperparameters that effectively use cross-project information and yield satisfactory performance remains challenging. In this paper, we resolve this bottleneck by formulating CPDP as a multi-objective bilevel optimization (MBLO) method, dubbed MBL-CPDP. It comprises two nested problems: the upper-level, a multi-objective combinatorial optimization problem, enhances robustness and efficiency in optimizing ML pipelines, while the lower-level problem is an expensive optimization problem that focuses on tuning their optimal hyperparameters. Due to the high-dimensional search space characterized by feature redundancy and inconsistent data distributions, the…
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Taxonomy
TopicsManufacturing Process and Optimization · Industrial Vision Systems and Defect Detection · BIM and Construction Integration
