Self-Healing in Dielectric Capacitors: a Universal Method to Computationally Rate Newly Introduced Energy Storage Designs
Nadezhda A. Andreeva, Vitaly V. Chaban

TL;DR
This paper introduces a universal computational method to evaluate and rate new dielectric capacitor designs based on their self-healing capabilities and micro-discharge behavior, enabling rapid screening of innovative energy storage solutions.
Contribution
The authors developed a novel theoretical approach combining electronic-structure simulations to assess the self-healing potential of dielectric capacitors, which is a significant advancement over traditional empirical testing.
Findings
Best-performing designs produce volatile by-products after micro-discharge
Soot samples exhibit lower electronic conductivities
The method accurately rates empirical capacitor performance
Abstract
Metal-film dielectric capacitors provide lump portions of energy on demand. While the capacities of various capacitor designs are comparable in magnitude, their stabilities make a difference. Dielectric breakdowns - micro-discharges - routinely occur in capacitors due to the inevitable presence of localized structure defects. The application of polymeric dielectric materials featuring flexible structures helps obtain more uniform insulating layers. At the modern technological level, it is impossible to completely avoid micro-discharges upon device exploitation. Every micro-discharge results in the formation of a soot channel, which is empirically known to exhibit semiconductor behavior. Because of its capability to conduct electricity, the emerged soot channels harm the subsequent capacitor performance and decrease the amount of stored energy. The accumulation of the soot throughout a…
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Taxonomy
TopicsSupercapacitor Materials and Fabrication · Advanced Memory and Neural Computing · Electrocatalysts for Energy Conversion
