Topology optimization of contact-aided compliant mechanisms for tracing multi-kink paths
Prabhat Kumar, Roger A Sauer, Anupam Saxena

TL;DR
This paper introduces a topology optimization method for designing 2D contact-aided compliant mechanisms capable of tracing complex multi-kink paths, incorporating contact modeling and shape optimization techniques.
Contribution
It presents a novel topology optimization framework that integrates contact surfaces, boundary smoothing, and shape descriptors for designing complex compliant mechanisms.
Findings
Successfully designed mechanisms tracing multi-kink paths
Effective incorporation of contact modeling in topology optimization
Demonstrated path accuracy through optimized designs
Abstract
This paper presents a topology optimization approach to design 2D contact-aided compliant mechanisms (CCMs) that can trace the desired output paths with more than one kink while experiencing self and/or external contacts. Such CCMs can be used as mechanical compliant switches. Hexagonal elements are used to parameterize the design domain. Negative circular masks are employed to remove material beneath them and generate rigid contact surfaces. Each mask is assigned five design variables. The first three decide the location and radius of the mask, whereas the last two determine the presence of the contact surface and its radius. To ensure continuity in contacting surfaces' normal, we employ a boundary smoothing scheme. The augmented Lagrange multiplier method is employed to incorporate self and mutual contact. An objective is formulated using the Fourier shape descriptors with the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Numerical Analysis Techniques · Piezoelectric Actuators and Control · Advanced Measurement and Metrology Techniques
