Phase transformation and water adsorption behavior of ALD deposited and annealed Ru and RuO2 films

TL;DR

This study investigates how annealing affects the phase transformation and water adsorption properties of ALD-deposited ruthenium and RuO2 films, revealing insights into their surface chemistry for catalytic applications.

Contribution

It provides a systematic analysis of phase transformation from Ru to RuO2 and water adsorption behavior using advanced characterization techniques.

Findings

Gradual phase transformation from Ru to RuO2 with increased annealing temperature.

Surface water affinity increases with annealing temperature.

Water dissociation tendency varies with surface composition.

Abstract

Ruthenium metal and its oxide stand out for their exceptional catalytic activity, stability in Oxygen Evolution Reactions (OER) and electrical conductivity, making them indispensable in electronics and electrocatalysis. In this study, atomic layer deposition (ALD) was used to synthesize ruthenium thin films, and the subsequent annealing of deposited ruthenium films at different elevated temperatures resulted in a progressive phase transformation from ruthenium metal to ruthenium dioxide (RuO2). The films were systematically characterized using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and Raman spectroscopy. XPS was carried out with both soft X-rays from a lab-based instrument and tender X-rays from the synchrotron. The different probing depths of the techniques revealed the gradual transformation of Ru to RuO2 from the top surface as the annealing temperature was increased. The water adsorption behavior of the films was also assessed using ambient pressure XPS (APXPS) at different water vapor pressures. The influence of annealing conditions on the films affinity for water and tendency for water dissociation was analyzed to seek an initial understanding of the surface chemistry relevant to electrochemical water splitting.