Detection of Nanopores with the Scanning Ion Conductance Microscopy: A Simulation Study

TL;DR

This study uses simulations to demonstrate that scanning ion conductance microscopy can accurately detect and size nanopores formed during dielectric breakdown, with resolution influenced by probe size, distance, voltage, and concentration gradients.

Contribution

The paper presents a simulation-based analysis of SICM's effectiveness in in situ nanopore detection and size estimation during dielectric breakdown.

Findings

SICM accurately locates nanopores and estimates their relative sizes.

Detection resolution improves with larger probe sizes and closer probe-membrane separation.

Higher voltages and concentration gradients enhance detection resolution.

Abstract

During the dielectric breakdown process of thin solid-state nanopores, the application of high voltages may cause the formation of multi-nanopores on one chip, which number and sizes are important for their applications. Here, simulations were conducted to mimic the investigation of in situ nanopore detection with scanning ion conductance microscopy (SICM). Results show that SICM can provide accurate nanopore location and relative pore size. Detection resolution is influenced by the dimensions of the applied probe and separation between the probe and membranes, which can be enhanced under large voltages or a concentration gradient.